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Process Capability and its Relationship to the Associated Measurement System Capability
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by: H. Wayne Cotten
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Publication Date:
February 11, 2019
Book Size:
8.5" x 11"
Pages:
61
Binding:
Spiral Bound
Color:
Standard Black & White
Cover Finish:
Glossy
Paper:
60# Uncoated White
$25.00
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Must be > 0
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Book Synopsis
This book considers two process capability indicators (Cp,Cpk) in combination with four measurement system capability indicators and explores their mathematical relationships. This is motivated by a critical need to understand the impact a measurement system may have on a process assessment.
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